medical inspection systemWafer
| Title | Range | Discount |
|---|---|---|
| Bulk/tiered discount - sample | 1 - 5 | 5% |
| Bulk/tiered discount - sample | 6 - 10 | 10% |
| Bulk/tiered discount - sample | 11 - 15 | 15% |
| Bulk/tiered discount - sample | 16 - 20 | 20% |
| Bulk/tiered discount - sample | 21 + | 25% |
Description
Wafer Inspection System detects contaminations, or defects and errors, among circuit patterns on a silicon wafer by using SEM System or Dark Field System.
Thank you for reading this post, don't forget to subscribe!
No more offers for this product!
General Inquiries
There are no inquiries yet.
